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American Mineralogist; May 2000; v. 85; no. 5-6; p. 765-769
© 2000 Mineralogical Society of America
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In-situ high pressure X-ray diffraction of phase E to 15 GPa

Sean R. Shieh*, Ho-kwang Mao, Jürgen Konzett and Russell J. Hemley

Geophysical Laboratory and Center for High Pressure Research, Carnegie Institution of Washington, 5251 Broad Branch Road, N.W., Washington, D.C. 20015, U.S.A.

Correspondence: * E-mail: shieh{at}gl.ciw.edu

In-situ high pressure X-ray diffraction of phase E (free of secondary phases) measured up to 14.5 GPa shows that phase E is stable over this pressure range at room temperature. The pressure dependence of the lattice parameters are a = 2.967 – 0.011P + 0.0001P2 and c = 13.886 – 0.054P + 0.001P2 (P is in GPa). A least-squares fit to third-order of Eulerian strain theory yields a bulk modulus KT0 for phase E of 93 (±4) GPa and pressure derivative K'T0 of 5 (±1). The bulk modulus obtained by this study is about 10% lower than that obtained by Brillouin scattering. Phase E appears to have the lowest bulk modulus among DMHS. The OH stretching frequency of 3613 cm–1 indicates weak, if any, hydrogen bonding. The associated O-O distance of phase E is estimated to be 3.00–3.10 Å.




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