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Submicrometer optical characterization of the grain boundary of optically active Cr³⁺ doped polycrystalline Al₂O₃ by near-field spectroscopy

Yoshihito Narita^1,* and Hiroshi Murotani^2,

¹ JASCO Corporation, 2967-5, Ishikawa-cho, Hachoji-shi, Tokyo 192-8537, Japan
² Department of Electro Photo Optics, Tokai University, 1117 Kitakaname, Hiratsuka-shi, Kanagawa 259-1292, Japan

Correspondence: ^* E-mail: narita{at}jasco.co.jp

Near-field fluorescent spectroscopy was used to characterize the grain boundary of Cr-doped polycrystalline alumina. The results show that the peak widths in near-field spectra are narrower than in spectra obtained by conventional microspectrometry, and this is attributed to the difference in spatial resolution of the two methods. The R-line peaks of Cr³⁺ fluorescence were observed to shift to a lower wavelength at the grain boundary compared to the bulk crystal, which is attributed to stress relief at the crystal boundary. This peak shift at the boundary decreases as a function of the time a polycrystal is annealed at 1700 °C.