Quick Search:    advanced search

GSW Home   GeoRef Home   My GSW Alerts   Contact GSW   About GSW   Journals List   Help

This Article Figures Only Full Text Full Text (PDF) Alert me when this article is cited Alert me if a correction is posted Citation Map Services Email this article to a friend Similar articles in this journal Alert me to new issues of the journal Download to citation manager Google Scholar Articles by Kang, I. M. Articles by Moon, H.-S.

Finding the layer scattering origin of rectorite for basal peak calculations

¹ Korea National Oil Corporation, 1588-14, Gwanyang-dong, Dongan-gu, Anyang, Gyeonggi-do, 431-711, Korea
² Department of Chemistry, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea
³ Department of Earth System Sciences, Yonsei University, 134, Shinchon-dong, Seodaemun-ku, Seoul, 120-749, Korea

We calculate here the basal peak profiles of Na-rectorite (regularly interstratified Na-illite-smectite) with two different scattering origin choices, one based on the octahedral cationic plane and the other on the basal oxygen plane of the tetrahedral sheet. Our calculation shows that the scattering origin of the octahedral cationic plane, which has been often used in previous diffraction models, is ineffective for profiling the measured peak skewness and irrationality. Alternatively, the calculation using the scattering origin of the basal oxygen plane better mimics the measured peak profiles and provides more reliable crystallite thickness distributions for Bertaut-Warren-Averbach analyses. This origin is also useful for demonstrating the scattering sequence, the layer chemistry heterogeneity, and the effect of the crystallite margin on rectorite scattering.

Key Words: Rectorite • X-ray diffraction • scattering origin • basal reflections • layer boundary