Quick Search:    advanced search

GSW Home   GeoRef Home   My GSW Alerts   Contact GSW   About GSW   Journals List   Help

This Article Full Text Full Text (PDF) Alert me when this article is cited Alert me if a correction is posted Services Email this article to a friend Similar articles in this journal Alert me to new issues of the journal Download to citation manager Citing Articles Citing Articles via Google Scholar Google Scholar Articles by Fittipaldo, M. Search for Related Content

ELECTRON MICROPROBE ANALYSIS AND SCANNING ELECTRON MICROSCOPY IN GEOLOGY (2nd ed.)

by S.J.B. Reed, Cambridge University Press, August 2005. 206 pages, $70.00

Earth and Environmental Sciences, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, U.S.A.

The first 20% of the full text of this article appears below.

In this book, the author aims to describe electron microprobe analysis (EMPA) and scanning electron microscopy (SEM) from a geologic standpoint, a goal that he clearly states on the first page. The author adequately meets this goal throughout the book. He initially provides discussion of how EMPA and SEM can be used to answer specific geologic questions and later gives examples, illustrations, and images of geologic data acquired using these techniques. The material is not necessarily presented in a "how-to" manner of conducting EMPA and SEM analyses, instead the author provides background material that needs to be considered when setting up for such analyses.

The book consists mostly of individual chapters designed to explain the principles, instrumentation, and techniques of EMPA and SEM. The book is well illustrated and offers several . . . [Full Text of this Article]